Nanotronics Unveils New Products Driven by Advances in Artificial Intelligence and Machine Learning at SEMICON WEST 2018

BROOKLYN, N.Y–Nanotronics, developer of  robotic industrial microscopes, is debuting new microscopy products and software capabilities at the flagship U.S. event for connecting the electronics manufacturing supply chain this week, SEMICON West 2018. The new innovations on exhibit this week include broad improvements to inspection technologies, from greater proficiency in artificial intelligence-driven automation and analysis to improving system speed and efficiency, leveraging proprietary developments in machine learning.

Matthew Putman, CEO and founder of Nanotronics, remarked, “research and development are core tenets of our business. To innovate, we believe in pushing the boundaries of what we know, discovering, creating and testing breakthrough technologies that are smarter, more efficient and provide long-lasting value to our global customer base.”

Details on Nanotronics’ new products and innovations in scanning operations include the following:

  • nSpec Wallabout PS+ with dual end-effectors and linear motor stage with continuous scanning, quadrupling system throughput. The system can sort wafers based on pass/fail criteria.
  • nSpec Pinnacles PS 300mm FOUP system – the only automated inspection and defect review station that offers full wafer scanning and defect classification, mask inspection and AFM on a single tool for less than a million dollars.
  • Gen2 artificial intelligence analyzers capable of learning defects with minimal training data for bare, patterned, or devices
  • Post-packaging inspection on post-diced wafers on hoop rings, in waffle or gel packs, and machine learning based theta correction offering high tolerance for die-shift and rotation.

Nanotronics is exhibiting at booth #6243 at SEMICON West through July 12th.

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