Koh Young Technology Unveils New AOI Solution for Backend Process with its KY-P3 Pin Inspection Solution at IPC APEX Expo
January, 2018 – Chandler, AZ – Koh Young Technology, the leading 3D measurement inspection solutions provider, will highlight innovative solutions at IPC APEX Expo. Koh Young will demonstrate new backend process AOI capabilities with the KY-P3 3D pin inspection solution in Booth 2733 at 2018 IPC APEX Expo, which is scheduled for February 24 to March 1, 2018 in the San Diego Convention Center.
Based on its world-class 3D AOI measurement technology, Koh Young designed the KY-P3 to overcome longstanding industry challenges like long programming time and high false call rates. Following its vision to “Measure Everything, Everywhere”, the new Koh Young KY-P3 delivers true 3D inspection data for single array, forked, press-fit, and other pin configurations, as well as applications like Final Optical Inspection (FOI) for engine control units. The system also measures pin height, solder height, and pin tip separation with accuracy and repeatability.
Beyond pin measurement and inspection, the new KY-P3 incorporates the latest technologies that make programming faster and easier. The Koh Young AI-driven Auto Programming software allows
For Immediate Release
users to quickly generate inspection condition settings using our leading-edge Artificial Intelligence engine and optimized graphical user interface. The recognized leader in electronics measurement and inspection, Koh Young is expanding its technology beyond the PCB industry.
Koh Young will highlight a broad range of innovations, while participating in several show activities, including topical roundtable discussions and interviews on the smart factory and inspection process. If you cannot attend IPC APEX Expo and visit Koh Young at booth 2733, you can learn more its best-in-class inspection solutions at www.kohyoung.com.