iNEMI/SMTA Technical Webinar Series
Proposed Testing Protocols to Align Connector Reliability with Application Requirements
Tuesday, June 16 / 11:00 a.m. EDT (Americas)
Since the 1980s there has been enormous growth in the use of electronic devices, which has driven similar, if not greater, growth in the number of electrical interconnects. As we become more dependent on these devices the need to understand the applications and ensure their reliability becomes more critical. Two factors complicate this effort. The first is the reduction in size of electrical contacts and the commensurate reduction in contact normal force available to ensure a stable interface. The other factor is that reliability is not free. Thus, as the number of interconnects increases, cost considerations drive a need to ensure the reliability of connectors is matched to the needs of their specific applications. Testing protocols to help achieve this match and thus ensure the required reliability will be discussed in this presentation.
Vincent C. Pascucci is the presenter for this webinar. He is Senior Principal Engineer, managing the Failure Analysis and Reliability Engineering group within TE Connectivity’s Aerospace, Defense, and Marine business unit. Vince also chaired Phase 1 of iNEMI’s Connector Reliability Test Recommendations Project.
This webinar is open to everyone; advance registration is required. For additional information and to register.