Matric Sees Yield Improvements with Pre-Reflow AOI
The more we inspect, the higher our yield, it’s that simple. Well perhaps it’s not that simple, but it seems that the addition of another
The more we inspect, the higher our yield, it’s that simple. Well perhaps it’s not that simple, but it seems that the addition of another
Atlanta, Georgia – Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will discuss the benefits of combining IPC-DPMX with IPC-CFX to deliver data
Continuous developments and implementation of new technologies such as organic-substrate-interposer technology and silicon-via-interconnection technology in the semiconductor assembly & testing services market are creating significant
EMSNOW Publisher Eric Miscoll caught up with Koh Young’s Ramon Hernandez and Luis Tapia from Repstronics at the recent SMTA Guadalajara Expo show and talked
Atlanta, Georgia – Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will share its perspective on test standards, systems, and criteria for