Wide bandgap (WBG) power semiconductors, such as silicon carbide (SiC) and gallium nitride (GaN), are materials that offer huge potential for enabling higher-performing, energy-efficient systems. Applications for WBG power semiconductors range from automotive to space electronics.
Since WBG materials operate at higher voltages, frequencies and temperatures than traditional silicon, standards are essential to validate long-term reliability, define uniform datasheet parameters, establish safety criteria and influence packaging designs across all applications.
With the need for standardization growing, prospective users of WBG power devices are collaborating within JEDEC (the Joint Electron Device Engineering Council) to develop guidelines to broaden adoption.
JEDEC is the global microelectronics industry’s primary standards organization. Made up of over 350 member companies, it develops open standards and universal guidelines for semiconductors, packaging and computer memory to ensure components from different manufacturers are interoperable and reliable.
Thousands of volunteers representing over 380 member companies work together in more than 100 JEDEC committees and task groups to meet the needs of the industry for manufacturers and consumers alike. The publications and standards generated by JEDEC committees are accepted throughout the world. It provides engineers with standardized frameworks to improve protection design and system robustness as well as test consistency in power electronic applications like electric vehicles and industrial drives.
JEP203 (Guideline for Short Circuit Evaluation in Power Conversion Transistors) and JEP204 (Catalog of Stress Procedures for Silicon Carbide Devices for Power Electronic Conversion) were developed by the standards organization’s JC-70.2 Silicon Carbide Subcommittee. They outline standard test methods and test circuit parameters designed to ensure that devices can handle faults consistently without catastrophic failure.
The two documents support the growing adoption of SiC power semiconductors. To help device manufacturers and qualification engineers validate the short-circuit ruggedness of WBG transistors, JEP203 is an industry guideline that outlines tests and allows component suppliers and system designers to mutually agree upon data, safety margins and long-term reliability expectations.
Reliability and Ruggedness Stress Procedures
Similarly, JEP204 is a comprehensive reference covering reliability, environmental and ruggedness stress procedures for SiC power devices. The publication gives design engineers and device manufacturers a common framework for evaluating long-term reliability and performance, helping accelerate industry alignment and increase confidence in next-generation SiC power electronics. It gives qualification engineers and device manufacturers a common framework for evaluating long-term reliability and performance.
JEP203 and JEP204 are guidelines for SiC power conversion that will enable the industry to confidently adopt silicon carbide in demanding power electronic applications. JEP204, in particular, provides a comprehensive framework of best practices for stressing SiC power devices, offering significant value to both users and suppliers.
Developed by JEDEC’s JC-70.2 Silicon Carbide Subcommittee, JC-70 was formed in October 2017 with twenty-three member companies and now has over 70 member companies, which underscores industry commitment to the development of universal standards to help advance the adoption of wide bandgap (WBG) power technologies). Interested companies worldwide are welcome to join JEDEC to participate in this important standardization effort. The next JC-70 committee meeting will be held on July 15, 2026
‘’These new documents give engineers and manufacturers the tools to design safer systems, validate long-term reliability and align industry practices,” said Dr. Thomas Aichinger, Senior Principal Engineer, SiC Technology Development, Infineon Technologies, and the vice-chair of the JC-70.2 subcommittee.
JEP203 and JEP204 are available for free download from the JEDEC website (a free user account may be required to download).
