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吉时利白皮书描述半导体特征与参数测试挑战


Mar 26, 2009

先进电气测试仪器与系统专家吉时利仪器有限公司(纽约证交所:KEI)已出版白皮书,描述半导体特征与参数测试解决方案正如何发展以适应半导体行业的瞬息万变。

该白皮书描述了影响行业的新兴技术和企业动态,包括日益增长的厂商支持需求。它还讨论了塑造吉时利向行业供应的测试解决方案的新兴市场力量,包括不断上涨的非易失性存储器需求、大规模数据源、增强设备可靠性测试、对能量变换/能效设备的兴趣,以及有关最新半导体材料的测试要求。

白皮书还描述了吉时利针对这些半导体测试挑战的解决方案,包括:

——Series 2600A系统SourceMeter仪器
——Model 4200-SCS半导体特征分析系统
——自动特征分析套件(ACS)系统
——其它高速、高精确度仪器

白皮书下载地址:www.keithley.com/navigate






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