YESTech introduces YTX-5000 in-line automated inspection system
Apr 18, 2005
YESTech, a provider of yield enhancement solutions announced the introduction of its YTX-5000 in-line automated x-ray inspection system.
YESTech's versatile YTX-5000 Dual Technology Inspection System combines both automated optical (AOI) and x-ray (AXI) inspections to provide the highest level of defect detection for SMT manufactures. The YTX-5000 inspects for both visible and hidden defects on BGA's, flip chips and other area array devices. Other typical inspections include solder joints, leads, component presence and position, correct part, polarity, color and through-hole parts. Features include auto-zoom 130Kv x-ray, enhanced AOI capability, off-line programming and real-time SPC data collection.
The YTX-5000's image processing technology integrates normalized correlation and rule-based algorithms to provide complete inspection coverage with an extremely low false failure rate. Programs created with the YTX-5000 are also compatible with YESTech's AOI systems.
Operators typically take less than 30 minutes to create a complete inspection program with the YTX-5000. The system utilizes a standard package library to simplify training and insure program portability across manufacturing lines. Remote programming of the unit maximizes machine utilization while real-time SPC monitoring provides a valuable yield enhancement solution.
For more information visit YESTech at www.yestechinc.com.