Teradyne announces FrameScan(TM) FXA advanced Vectorless test tool
Apr 26, 2005
Early adopter web workshops begin April 26, 2005 at 9:00 a.m. and 3:00 p.m. (EDT, GMT -4:00).
Teradyne announced FrameScan FX, an advanced vectorless test tool for detecting open pins on components and connectors assembled onto PCBs (printed circuit boards). FrameScan FX uses an enhanced in-circuit capacitive coupling technique that tests for open pins by applying an AC signal to an un-powered PCB node and measuring the voltage coupled to a plate positioned in close proximity to the component or connector being tested. Using FrameScan FX, users can detect open pins more accurately and with greater repeatability.
FrameScan FX is a complete hardware and software suite that can extend a user's measurement capabilities. It solves test issues associated with the many smaller device packages and connector technologies used on today's board designs. FrameScan FX hardware improvements include a new low-noise op amp that increases the front-end gain of the active probe to minimize the effects of noise upon other stages of the measurement circuit. Software improvements include an automatic Precision Mode that increases the number of measurement samples for low measurement signals. The combination offers the highest-performance capacitive opens test technique in the industry. For more information about FrameScan FX and its capabilities, visit http://www.teradyne.com/ict/teststation-in-circuit-test/framescan.html
Early adopter web workshops begin on April 26, 2005 at 9:00 a.m. and 3:00 p.m. (EDT, GMT -4:00) and are free for public viewing. These workshops are suitable for in-circuit production/QA/test engineers and their managers at electronics assembly manufacturers worldwide. Morning and afternoon workshop content is identical. Both contain an in-depth look at this new vectorless test technique. Visit https://teradyne-atd-events.webex.com to register.