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NPL announces DTI funded project

Mar 05, 2003

The National Physical Laboratory has announced that it is working to characterise whiskering potential on tin coatings with partners: Shipley, Schloetter Company, Enthone, CML and ESA. Lead-Free finishes based on tin coatings can produce a defect, known as a whisker, these are very thin but can be up to a millimetre in length and potentially cause catastrophic shorts.Recent developments have significantly reduced whiskering, and furthermore measurements of the stress in the coatings have indicated the likelihood of whisker growth. This DTI funded project will look at measuring the stress in coatings, using X-ray diffraction, to predict the whisker propensity. The project aims to produce an accurate test that is widely applicable.Source: PCBnewsline

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