Seica and JTAG Technologies partner to provide comprehensive fixtureless test capability system
Jan 31, 2005
SEICA, SpA. and JTAG Technologies, today announced the integration of their test methods within the Seica Pilot(TM) and Pilot LX(TM) flying probe in-circuit test systems. As a result, electronics designers and manufacturers will benefit from even greater testability and programmability of complex boards, all within a single process step.
Seica's flying probe systems are already among the most successful and advanced fixtureless test systems on the market with comprehensive shorts/opens, analog, power-up, vectorless, and AOI testing. The integrated boundary-scan capabilities-Powered by JTAG Technologies(TM)-will now further enhance their high-precision digital testing capabilities. Test development and deployment times are minimized, test coverage is maximized, and fixturing is negligible, even for complex digital PCBs where physical access to electrical nodes is limited. The JTAG Technologies tools also provide high throughput in-system programming, via boundary-scan of on-board flash memories and PLDs.
Antonio Grassino, Owner of Seica, SpA. says, "Our customers have asked us to integrate boundary-scan into our products. In order to meet this request for high-performance digital testing, we are very pleased to combine with JTAG Technologies in offering an integrated solution. Customers will gain greater test coverage while maintaining fixtureless test access."
Pilot and Pilot LX systems equipped with JTAG boundary-scan capabilities are available immediately via Seica's distribution channels with pricing for the boundary-scan option ranging from about $11K to $19K.
For more information, visit www.jtag.com or www.seica.com.