FEINFOCUS completes 2004 global technical seminar series
Dec 29, 2004
FEINFOCUS, a manufacturer of high-resolution X-ray inspection systems, recently embarked on a global technical seminar program that included North America, Europe, and Asia. The seminar series is part of the continuing commitment of FEINFOCUS to inform the industry of recent developments in X-ray technology. Led by Dr. Udo E. Frank, director of technology development, the seminar series was conducted with the support of FEINFOCUS distributors in each region. Seminars covered a variety of topics, from basic X-ray inspection technology, covering the integral components of an X-ray inspection system, to more advanced X-ray technology, such as computed tomography and wafer bump inspection. Dr. Frank utilized simulated FEINFOCUS Graphical User Interface (FGUI) software to give attendees a realistic demonstration of the topics being covered. Due to the resounding success of the program, FEINFOCUS plans to expand the seminar series in 2005, with further information to be posted at www.feinfocus.com. "Overall I feel that the seminars were beneficial to the audience," commented Dr. Frank. "With consumer demand driving the miniaturization of products, it is important for electronics manufacturers to be up to date on the latest advancements in X-ray inspection technology."
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