X-Tek announces upgrades
Feb 13, 2003
X-Tek has announced the launch of a range of software upgrades available across its range of world-leading real-time microfocus x-ray inspection systems. A total of five new features are on release and available free of charge to any customers who have purchased X-Tek systems within the last two years. They include a 3D waterfall display that can be generated from a 2D image, an auto-focusing feature for all applications and improved support for the use of the latest flat panel sensors. Two upgrades specifically designed for the electronics inspection market are a drill offset measurement tool for PCB inspection and a Microsoft Excel output facility designed for BGA results analysis. X-Tek has also announced that from the end of March it will offer a full Windows XP support for customers wishing to migrate from Windows 2000.X-Tek expects to release further software upgrades throughout 2003 as part of its continuing product improvement programme.Source: PCBnewsline
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