Sigurd expands customer base by switching to Teradyne's FLEX

Teradyne, Inc. (NYSE: TER) announced that Sigurd, a subcontractor located in Chu-Tung Hsin-Chu, Taiwan, has purchased over ten FLEX semiconductor test systems. The substantial purchase of FLEX expands the device type and test range for Sigurd and thereby increases their Total Available Market (TAM) or potential customer base as they target the consumer IC test and assembly market. Sigurd's selection of Teradyne was also motivated by the low cost of device test the FLEX delivers due to the system's high throughput architecture. Sigurd will begin using the new FLEX systems for Optical Disk Drive (ODD) devices used in CD-R/W drives and DVD players.

According to Sigurd Chairman Sidney Huang, "Switching to Teradyne's FLEX was a clear choice as the test system selection provides us with a time to market advantage and the increased device test range that we need to aggressively compete as a test subcontractor. We look forward to the opportunity of growth that Teradyne's FLEX creates in the consumer IC portion of our business."

Dennis Keogh, Broadband Product Manager, Teradyne, added, "The FLEX architecture was designed to improve device test times while increasing the number of test sites. Sigurd's selection of FLEX validates how important these capabilities are for addressing the device testing needs of cost sensitive consumer SOC's. As Sigurd increases their capacity, we look forward to supporting their expanding consumer IC test customer base."

About FLEX
Breaking the cost of test barrier with high-efficiency multi-site test while meeting the demands of increasing complexity for an expanding range of devices, FLEX advances multiple test technologies. FLEX spans test requirements from conventional DFT and structural test to standard analog and mixed-signal to complex SOC. Its Tester-per-device-core architecture delivers a complete set of test resources to each device core, with instrument synchronization and control in device clock time on a vector-by-vector basis. The Universal Slot test head and high-density instrumentation allow easy reconfiguration to changing test needs, and the OpenFLEX open system architecture complements Teradyne's FLEX instrument suite, allowing the addition of focused instruments to further enhance system performance and test economics. To learn more about FLEX, visit http://www.teradyne.com/flex/