Machine Vision Products to display GEM series at Nepcon UK
May 20, 2004
Machine Vision Products Inc. has announced that it will display its new GEM Series Compact automated optical inspection system at Nepcon UK. MVP will be demonstrating its products in Exhibit H412 in Brighton, May 26 & 27, 2004, in cooperation with GM Distribution Ltd.
The Compact system is modelled after the high performance AutoInspector 1820 series, allowing similar advanced capabilities in a tabletop platform. “We are pleased to bring our experience and knowledge to the tabletop market,” said Dr. George Ayoub, President and CEO of MVP. “By bringing the same philosophy of comprehensive defect coverage to offline inspection, we are raising the bar of what the industry can expect in a compact, offline AOI system.”
The GEM Series Tabletop has a 50 percent smaller footprint than comparable systems. With full solder joint inspection and measurement capabilities similar to MVP’s existing inline systems, it offers an optimized price to performance ratio. Additionally, as an extremely flexible solution, the GEM Series Tabletop has complete compatibility and program portability with MVP’s inline inspection systems.
“The GEM Series is a great solution to those facilities looking to increase quality without incurring the expense of equally capable inline systems,” comments Dr. Ayoub. “If the goal is to inspect printed circuit boards offline, this product offers an excellent value.”