Phoenix x-ray systems introduces failure analysis system

phoenix|x-ray Systems + Services Inc., has introduced to the North American market their nanome|x, a high-powered nanofocus 4-in-1 failure analysis system. A combination of high-end x-ray technology packaged in an ergonomic, user-friendly design, the nanome|x is a powerful x-ray inspection and failure analysis system that can perform the most sophisticated nondestructive testing processes and resolve the most minute details. The system is designed to aptly meet manufacturers' requirements of complex semiconductor devices and highly integrated electronic assemblies yet can be used in the field of micromechanics and material testing as well. The company introduced the nanome|x to the North American market at APEX 2004 and initially introduced the system at Productronica in Munich, Germany in November 2003. The design is a result of a close partnership with its customers across several fields of applications. The nanome|x x-ray system deploys the company‚s ovhm|module technology that, without rotation of the board and thus loss of magnification in the oblique, allows for a high magnification (2000x) and 3D-like imagery with 2D magnification acquisition speeds. The intensifier in the system is a digital detector technology and video system that delivers superior, distinct images in pseudo real-time of poor absorbing materials with enhanced contrast, ideal for ndt and material inspection. The nanome|x is listed at $260,000 and is deliverable within four to six weeks. For more information, customers should contact David K. Lehmann, President, at 805.389.0911 ext. 11 or via e-mail at dklehmann@phoenix-xray.com Source: PCBnewsline