Agilent announces industry's first jitter subcomponent analysis capability

Agilent Technologies Inc. has introduced the industry's first jitter subcomponent analysis capability that can accurately separate random and deterministic jitter, and their subcomponents, from 50 MB/s to 40 GB/s. The Agilent 86100C Infiniium digital communications analyzer with jitter (DCA-J) adds detailed one-button jitter subcomponent analysis to the industry's leading wide-bandwidth sampling oscilloscope to enable faster, more accurate verification of the latest digital designs and components. The new DCA-J is a complete measurement solution that aims to offer unprecedented analysis accuracy with easy, one-button measurement at a breakthrough price. Design and test engineers working on standards such as CEI, XFP, Fiber Channel, Gigabit Ethernet and PCI Express can use the DCA-J to quickly measure jitter subcomponents such as random jitter, deterministic jitter, data dependent jitter, pattern jitter, inter-symbol interference and duty cycle jitter. These measurements are critical to finding and eliminating signal integrity issues that delay getting new products to market. "The new jitter analysis capability of the DCA-J provides irreplaceable visibility for the challenges of jitter characterization of our world-class products," said Anthony Sanders, principal engineer at Infineon Technologies. "The speed of the DCA-J is impressive," said Steve Hubbins, silicon evaluation specialist at Texas Instruments. "Data dependent jitter measurements that used to take hours have been reduced to less than a minute." Source: PCBnewsline