ARM selects XJTAG for RealView development tools debug and test
Sep 06, 2007
XJTAG has announced that ARM has selected the XJTAG boundary scan development system to improve and speed up the process of debugging and testing its range of ARM® RealView® development hardware tools, which include high-density, multi-layer development boards.
ARM is currently using XJTAG on its latest generation of RealView platform baseboards, which contain multiple high pin-count ball grid array (BGA) devices including processors, application specific integrated circuits (ASICs), field programmable gate arrays (FPGAs) and complex programmable logic devices (CPLDs).
Spencer Saunders, engineering manager, platforms, System Design Division, ARM, said: "With tens of thousands of pins on each board, we recognised that it would not be possible to validate these circuits in a commercially realistic timescale without the use of a boundary scan test system. After evaluating the different competitive options, we selected the XJTAG boundary scan system due to its power, performance, versatility and cost effectiveness."
The XJTAG system has enabled ARM to speed up the process of debug and test, get test coverage up to the 90 percent mark, achieve its ten-minutes-per-board boundary scan production test target, and to significantly improve production yields.
For more information about the XJTAG system, visit www.xjtag.com