Agilent and GCT Semiconductor to implement WiMAX test system
Jul 11, 2007
Agilent Technologies Inc. has announced plans to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets, which will accelerate manufacturing throughput and allow mass production deployment.
Agilent will support GCT chipsets with its E6651A Mobile WiMAX Test Set and MXZ-1000 WiMAX Manufacturing Test System. The initial GCT chipset supported will be for 2.3 GHz wave 1 mobile WiMAX products, consisting of GCT's GDM7201S baseband chip and the GRF7201 RF chip, and will be followed by mass deployment of 2.5 GHz wave 2 mobile WiMAX chipsets.
The Agilent Mobile WiMAX Test Set, equipped with its Wireless Test Manager and automation software package, can be used to calibrate and verify performance of GCT-based devices and to test many aspects of functionality such as network entry.
The Agilent MXZ-1000 WiMAX Manufacturing Test System, which now offers GCT chipset library, is optimized to directly control GCT chipsets and enables the highest possible measurement throughput.
"We're pleased to be partnering with Agilent to develop a solution that enables customers to thoroughly test device functionality and quickly ramp up their volume. GCT is well positioned to play a leading role in the expanding WiMAX market by delivering key components to further accelerate the deployment of WiMAX networks. We look forward to a continued relationship working with Agilent." said Dr. Kyeongho Lee, president and CEO of GCT Semiconductor.