Agilent Technologies introduces low-cost in-circuit test for ODMs
Apr 26, 2007
Agilent Technologies Inc. has introduced a low-cost in-circuit test system for original design manufacturers who need "just enough test." The new system provides a cost-effective means to achieve the highest confidence in testing high-volume digital consumer and personal computer motherboards.
Unlike manufacturing defects analyzer (MDA) test systems and other in-circuit test (ICT) systems that employ older-generation TestJet technology pioneered by Agilent, Medalist i1000 offers the cutting-edge Agilent VTEP v2.0 vectorless test suite. VTEP v2.0 comprises the award-winning iVTEP and the new Network Parameter Measurement technology, offering unparalleled coverage of micro ball grid arrays and flip chips, as well as power and ground pins for connectors commonly found in digital consumer products and desktop PCs.
Compatible with most MDA fixtures, the Agilent Medalist i1000 provides investment protection for manufacturers who wish to upgrade their existing MDAs to obtain greater test capabilities.
"Current test strategies employed for MDAs are being challenged by the increasing complexity of today's electronic boards," said NK Chari, Agilent's marketing manager for ICT. "The Medalist i1000 couples cost-effectiveness with advanced test features, making it a unique, affordable solution that can help manufacturers boost productivity with its ease-of-use and extensive defect-coverage capabilities."