A.T.E Solutions announces design course

A.T.E. Solutions, Inc., a leading test and testability consulting and educational firm has announced that it will teach the intensive 3-day course entitled "Design for Testability and for Built-In Self Test" course in Houston, TX on June 25-27, 2007. The course will be taught by Louis Y. Ungar.
 
"In this course attendees will learn all aspects of Design for Testability, from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. They will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs," Ungar says. The course will provide "specific guidelines for both digital and analog circuit testability. It will include structured testability techniques, such as internal and boundary-scan. Attendees will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations.  The more recent IEEE 1149.4 and 1149.6 boundary-scan techniques will also be included."
 
The second part of the course, will cover built-in self test (BIST). It will include structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks attendees will be able to evaluate a number of BIST architectures. BIST Software techniques will also be covered.
 
At this early date you may reserve your space without a full registration.  See http://www.besttest.com/Courses/00001-DFTBIST.cfm  for more information.