A.T.E Solutions to present course

A.T.E. Solutions, Inc., a leading test and testability consulting and educational firm will present the one-day course "Cost Effective Tests Using ATE, DFT and BIST" on April 11, 2007 in New York, NY.  The goal of the course is to bring together the technical and managerial aspects of Automatic Test Equipment (ATE), Design for Testability (DFT) and Built-In Self-Test (BIST) before an audience consisting of both engineers and managers.
 
"Test is a technical solution to an economic problem," maintains Louis Y. Ungar, President of A.T.E. Solutions, Inc. and the instructor of the course.  "Technical people need to understand the economics of finding faults in the factory as opposed to having them escape to customers.  Similarly, management has to recognize the difficulty of uncovering and locating some faults and the great burden placed on test.  One cannot simply rely on a single ATE to find all faults.  Solutions, such as DFT and BIST are technically sound, but without management's understanding and subsequent support, they may not get implemented."
 
Having taught this course several times at conferences such as APEX in Los Angeles, Mr. Ungar wants to bring it before an East Coast audience in the most central location, New York City, making it readily accessible to engineers in neighboring states (and countries).  "The one-day format is quite challenging," admits Ungar, "but if we want to have managers in the course, we cannot expect them to be available for more than one day."
 
The course is described in detail at http://www.besttest.com/Courses/00001-CostEffectiveTest.cfm.