SCANFLEX now offers off-the-shelf support for Environmental Chambers
Dec 15, 2006
GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, extends its JTAG/Boundary Scan hardware platform SCANFLEX┬« with two new components referred to as TIC03.
These new TAP Interface Cards (TIC) have been designed specifically for the integration in Environmental Chambers for IEEE 1149.x based monitoring of stress tests such as HALT (Highly Accelerated Life Testing) and HASS (Highly Accelerated Stress Screening).
"The increasing complexity of modern boards is prompting many of our customers to utilize stress based test procedures and screenings", says Bettina Richter, Marketing and International Sales Manager for GOEPEL electronic. "With these new TAP Interface Cards, our innovative SCANFLEX┬« platform now provides a professional off-the-shelf solution for such applications."
Further information can be found on the Internet at www.goepel.com.