phoenix|x-ray wins Global Technology Award 2006
Oct 16, 2006
phoenix|x-ray has announced that it has been awarded the coveted Global Technology Award 2006 in the category "Best Inspection/X-ray system" for its novel 160kV nanofocus® computed tomography system nanotom®.
The award was presented by Global SMT & Packaging Magazine during Assembly Technology Expo in Rosemont, Chicago. The independent panel of international experts from industry and research chose the nanotom for its high degree of technical innovation and outstanding ease-of-use.
The nanotom is said to be the first 160 kV nanofocus computed tomography system ever to cater specifically to applications in sensorics, materials science, electronics and the semiconductor industry. The nanotom enables the analysis of internal structures of complex electronic devices at highest resolutions.
This super- compact system features a granite base, a 160 kV high-power nanofocus X-ray tube by phoenix|x-ray and a special high-resolution digital detector for voxel resolutions in the < 500 nm (0,5 um) range featuring a 5-megapixel resolution and virtual detector plane for the highest possible magnification and resolution.