X-Tek Group announces new 3D Imaging
Sep 25, 2006
The X-Tek Group, a leading manufacturer of real-time microfocus x-ray systems, has announced the addition of Computerised Tomography (CT), a powerful new 3D imaging capability, to the advanced Revolution microfocus system. The Revolution features true concentric imaging, the highest degree of off axis tilt available and NanoTech(TM) open tube technology for unparalleled resolution and magnification.
CT produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects. X-Tek has made true 3D imaging available, affordable and simple to use.
The Revolution offers a greater degree of inspection than any comparable system with a viewing angle of up to 75o, just 15o to the plane of the board. This combination allows for maximum magnification (up to 6000x) at all angles over the entire 16" x 16" (410mm x 410mm) manipulator scan area, for 100% BGA, uBGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations. The NanoTechTM source offers improved defect detection due to feature recognition in the submicron range.
The Revolution system has also been upgraded to feature an advanced triple-mode programming interface incorporating off-line, teach-repeat and high level library function for program building.