Functional and in-circuit test system at Nepcon
Mar 28, 2006
For the first time in Europe Qmax will be presenting its latest functional and in-circuit test system at the Nepcon 2006 show in Birmingham.
The QT2128-320PXI was developed to address testing of the new generation of printed circuit assemblies where access to the board is restricted and the high level of integration of the components used means that previous component modelling styles of test cannot easily be implemented.
First introduced to the market in late 2005, the QT2128 has been selling well into the military sector of the board test and maintenance market and, says Rajkumar Clememt, Qmax's International Marketing Director, "we have had a very good reception for potential users in both the military and commercial markets and from our current launch platform we see the QT2128 rollout being very quick. The requirement is there and we have the solution."
The QT2128 provides a test bed where all of the test and access functions are fully integrated under one software suite. Physical access to the board can be through traditional methods such as bed of nails, where space permits, through the card edge through a JTAG "virtual edge" or any combination of these. Coupling these with fault diagnostics that can operate through guided probe or direct in-circuit test (ICT) the system is as at home with testing complex boards for go / nogo or for fault finding in the repair loop.
The whole of Qmax's range of test systems are based around a holistic approach where no one tool is brought to the test alone, but is integrated with other techniques to test the board as thoroughly as possible and locate the fault with the minimum of operator intervention.