RVSI Inspection to highlight WS-2800 wafer inspection system at SEMICON Japan 2005
Dec 06, 2005
RVSI Inspection LLC, a leader in semiconductor and package inspection, has announced that it will showcase WS-2800 Wafer Inspection System in HTL Co.'s booth, located at #10A-101 at the upcoming SEMICON Japan, scheduled to take place December 7-9, 2005, at the Makuhari Messe in Chiba, Japan.
The WS-2800 Wafer Inspection System provides superior yield management for defect inspection throughout post-fab processes for both standard and flip chip wafers up to 200 mm in diameter.
Defects created in the post-fab area between wafer processing and final manufacturing can negatively impact production yields and time-to-market. The WS-2800 quickly and reliably locates wafer defects and classifies them to reduce process costs and improve yield.
WS-2800 offers users numerous key benefits, including high-speed surface defect inspection, 100 percent inspection that ensures no escapes and an integrated inspection tool for fast response to process variations. The inspection step is a valuable addition to the entire wafer manufacturing process.