Mentor expands DFM strategy with YieldAssist diagnostics tool
Nov 01, 2005
Mentor Graphics Corporation (Nasdaq: MENT) announced the immediate availability of the YieldAssist(TM) diagnostic tool. With the ability to quickly and accurately identify and isolate yield-limiting defects, YieldAssist enhances semiconductor yield and expands Mentor's Design-for-Test (DFT) product portfolio and platform beyond classical test generation and defect detection. The product takes failure information directly from manufacturing test, and through advanced diagnostics, identifies failure causes to facilitate yield learning and eliminate weeks of manual analysis effort.
Accurate diagnosis of scan test failures is a critical element of failure analysis, and is becoming vital for yield learning and yield improvement purposes as nanometer technologies continue to shrink.