FEINFOCUS and INNOV-X Systems Announce Technology Alliance
Aug 10, 2005
FEINFOCUS, a COMET business unit and leading manufacturer of high-resolution microfocus X-ray inspection systems, announces a technology alliance with INNOV-X Systems, a manufacturer of high-performance portable X-ray Fluorescence (XRF) analyzers. The two companies are collaborating to introduce products to the global Electronics Assembly and Semiconductor Packaging markets.
COMET recently exhibited the INNOV-X Hawk-i solder paste analyzer at SEMICON West 2005, which offers yield accuracies of 0.1 - 0.5%. The Hawk-i utilizes an air-cooled microfocus X-ray tube with a spot size of 0.2 - 6 mm for extremely precise analysis. Powered by proprietary user-friendly parameter software, it can detect even the slightest variances in a solder joint. Plus, the innovative and compact geometry of the tool allows for inspection of a variety of sample shapes and sizes. The INNOV-X Hawk-i features a standard Windows® computer with single-button operation. Advanced options include an enhanced spot size of 0.1 - 13 mm, a joystick with automatic X-Y stage positioning, and a liquid sample adapter with specialized liquid analysis software.
"We are delighted to announce our alliance with INNOV-X Systems," said Jon Dupree, FEINFOCUS Business Unit Manager for COMET North America. "As a global leader in microfocus X-ray inspection, FEINFOCUS has set high standards for inspecting the integrity of solder bonds in components. This joint venture with the industry leader in XRF analyzers allows us to also offer advanced technology in analysis of the chemical composition of solder to our customers in the electronics assembly and semiconductor packaging industries."