AMI Semiconductor selects Teradyne FLEX test platform
Aug 10, 2005
Teradyne, Inc. (NYSE:TER) announced that AMI Semiconductor (NASDAQ: AMIS), a designer and manufacturer of integrated mixed-signal semiconductor products, has chosen the Teradyne® microFLEX(TM) test system from the FLEX(TM) Test Platform in a competitive selection process and ordered multiple systems. The systems will be used for engineering test development and production test of AMI Semiconductor's wide range of next generation mixed-signal devices developed for automotive, medical and industrial applications.
The microFLEX systems are being installed at AMIS test development centers in the US and Europe. The systems will be deployed for production test with universal manipulators, enabling them to be used in both wafer probe and final test operations. The systems will be configured with a broad range of instrumentation covering multiple test requirements, including DC and microwave.
"The selection was based on the FLEX platform's broad test coverage, Teradyne's strong expertise in RF testing, and AMI Semiconductor's satisfaction with our current installed base of Teradyne J750 and Catalyst (TM) test systems," said Craig Nelson, director of worldwide mixed-signal test development at AMI Semiconductor. "We are confident that the FLEX architecture will lend significant strength to AMI Semiconductor's aggressive growth strategy in our key markets."
"AMI Semiconductor continues to expand their product portfolio and runs a high-mix manufacturing model that requires a flexible test approach capable of handling a wide array of products," said Jim McEleney, FLEX Platform marketing manager, Teradyne. "With the broad coverage and high throughput of the FLEX test platform, AMI Semiconductor is looking to achieve the lowest cost-of-test possible. The microFLEX test system is well-positioned to support AMI Semiconductor's overall test and production objectives."