Seica present S40 at the XIAN Defence Show China, booth # A1/091
Aug 17, 2005
S40 Compact - ONE SYSTEM, MANY SOLUTIONS The S40 Compact meets the growing need for an automatic, versatile system to perform functional tests on boards or electronic assemblies to replace dedicated, single-product test. Thanks to its open architecture, the S40 Compact can integrate external hardware and software modules, to provide a complete solution for functional testing, whether it be analog or digital, in AC or DC, at low or high voltage levels. The core of the system includes a set of extremely flexible relay matrices, a series of current/voltage generators and meters and very powerful, easy-to-use software running under Windows NT/2000/XP, able to satisfy a wide range of testing requirements. The relatively small dimensions of the S40 Compact make it easy to move from one place to another on the manufacturing floor, minimizing setup time when changing the product to be tested. The S40 Compact can be used in a large variety of applications, such as:
-- Serial programming of memory devices and microcontrollers
-- Final test for finished products (car alarm systems, furnace control systems, etc…)
-- Simulation of sensors and transducers to test and adjust thermo-regulators
-- Functional tests for instrumentation dedicated to "automotive" applications
-- Automatic marking of tested product
-- Burn-in test combined with climatic chambers
-- Visual inspection of LED or LCD displays via a high resolution, fixed camera www.seica.com
|
